Publications Scientifiques
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Item Speed-up of high accuracy analog test stimulus optimization(1999) Khouas, Abdelhakim; Derieux, AnneAnalog integrated circuit testing and diagnosis is a very challenging problem. The inaccuracy of measurements, the infinite domain of possible values and the parameter deviations are among the major difficulties. During the process of optimizing production tests, Monte Carlo simulation is often needed due to parameter variations, but because of its...Item Methodology for Fast and Accurate Analog Production Test(1999) Khouas, Abdelhakim; Derieux, AnneThis paper describes a new technique to reduce the number of simulations required during analog fault simulation. The method takes into account process parameter variations and aims to reduce the number of the computational expensive Monte Carlo simulations often required during analog fault simulation. In section I a review of the state of the art.Item Speed-up of High Accurate Analog Test Stimulus(1999) Khouas, Abdelhakim; Derieux, AnneAnalog integrated circuit testing and diagnosis is a very challenging problem. The inaccuracy of measurements, the innite domain of possible values and the parameter deviations are among the major diOEculties. During the process of optimizing production tests, Monte Carlo simulation is often needed due to parameter variations, but because of its expensive computational cost, it becomes the bottleneck of such a process. This paper describes a new technique to reduce the number of simulations required during analog fault simulation. This leads to the optimization of production tests subjected to parameter variations. In section I a review of the state of the art is presented, section II introduces the algorithm and describes the methodology of our approach. The results on CMOS 2-stage opamp and conclusions are given in sections III and IV