Publications Scientifiques

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Start date: 1992End date: 1999Has files: No

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    Speed-up of high accuracy analog test stimulus optimization
    (1999) Khouas, Abdelhakim; Derieux, Anne
    Analog integrated circuit testing and diagnosis is a very challenging problem. The inaccuracy of measurements, the infinite domain of possible values and the parameter deviations are among the major difficulties. During the process of optimizing production tests, Monte Carlo simulation is often needed due to parameter variations, but because of its...
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    Methodology for Fast and Accurate Analog Production Test
    (1999) Khouas, Abdelhakim; Derieux, Anne
    This paper describes a new technique to reduce the number of simulations required during analog fault simulation. The method takes into account process parameter variations and aims to reduce the number of the computational expensive Monte Carlo simulations often required during analog fault simulation. In section I a review of the state of the art.
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    Speed-up of High Accurate Analog Test Stimulus
    (1999) Khouas, Abdelhakim; Derieux, Anne
    Analog integrated circuit testing and diagnosis is a very challenging problem. The inaccuracy of measurements, the innite domain of possible values and the parameter deviations are among the major diOEculties. During the process of optimizing production tests, Monte Carlo simulation is often needed due to parameter variations, but because of its expensive computational cost, it becomes the bottleneck of such a process. This paper describes a new technique to reduce the number of simulations required during analog fault simulation. This leads to the optimization of production tests subjected to parameter variations. In section I a review of the state of the art is presented, section II introduces the algorithm and describes the methodology of our approach. The results on CMOS 2-stage opamp and conclusions are given in sections III and IV
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    Experimental determination of work function of silver alloys
    (1994) Lefort, Andre; Akbi, Mohamed; Parizet, Marie-Jose
    Models about arc roots need a good knowledge of physical constants characterizing contact material. With pure metal, all the constants are well known; but for alloys some are not known. In this paper we relate how we have measured work function of silver alloys. Measuring method used is the Fowler one where photoelectronic current produced by different ultraviolet radiations is measured in high vacuum. Experimental set-up have been tested for pure materials and then, have been applied to some silver alloys. Results about pure metals show an evolution of the work function with temperature; it decreases when temperature increases. Results about silver-nickel alloys show a large dependence of obtained results with the preparation of contact surface. For example, polishing and cleaning induce, because of atom migration, a large modification of the ratio of the two components on surface; this phenomenon induces a variation of work function comparatively with obtained values with prLtary product. By heating alloy contact in high vacuum we have observed large variations of work function, which result from material component vaporisation by sheets. Surface analyses by electron microscope produce proves of the phenomenon. An empirical relation is given to calculate work function of binary alloy when this constant is known for each alloy component