Characterization of Thin Layer SnO 2 /Glass by Neutrons Reflectometry

dc.contributor.author	Khelladi, Mohamed Fadel
dc.contributor.author	Izerrouken, M.
dc.contributor.author	Kermadi, Salim
dc.contributor.author	Tala-Ighil, Razika
dc.date.accessioned	2021-02-18T07:10:38Z
dc.date.available	2021-02-18T07:10:38Z
dc.date.issued	2009
dc.description.abstract	The thermal annealing behavior of the SnO2 thin films elaborated by sol-gel method has been studied by the neutrons reflectivity technique. From the fit of the experimental data using Parratt32 software program developed at HMI, Berlin, scattering length density, thickness and roughness are extracted. The obtained results show that the film thickness increases with the increasing annealing temperature, and the roughness is higher at 500 °C. Whereas, approximately, the same scattering length density is obtained after each annealing temperature	en_US
dc.identifier.issn	1662-9752
dc.identifier.other	https://doi.org/10.4028/www.scientific.net/MSF.609.155
dc.identifier.uri	https://www.scientific.net/MSF.609.155
dc.identifier.uri	https://dspace.univ-boumerdes.dz/handle/123456789/6451
dc.language.iso	en	en_US
dc.publisher	Scientific.net	en_US
dc.relation.ispartofseries	Materials Science Forum (Volume 609);
dc.subject	Neutron Reflectivity	en_US
dc.subject	Sol-Gel (SG)	en_US
dc.subject	Thin Film	en_US
dc.subject	TiN Dioxide	en_US
dc.title	Characterization of Thin Layer SnO 2 /Glass by Neutrons Reflectometry	en_US
dc.type	Article	en_US

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