Charge-extraction technique for studying the surface-states in MOS devices

Bouderbala, Rachid2015-06-072015-06-071992https://dspace.univ-boumerdes.dz123456789/1466198 p. : ill. ; 30 cmenMOS (électronique)Metal oxide semiconductorsCharge-extraction technique for studying the surface-states in MOS devicesThesis