Benlatreche, Mohamed SalahRahmoune, F.Toumiat, O.2015-12-172015-12-17201103529045https://dspace.univ-boumerdes.dz/handle/123456789/2551enEquilibrium Voltage Step techniqueSi-SiO 2 interface trapsTrapsExperimental investigation of Si-SiO 2 interface traps using equilibrium voltage step techniqueArticle