Testable subsystems generation for fault detection and isolation using a structural matching rank algorithm testability of an electrical circuit

Alem, SaidMokhtari, HichamOuziala, MahdiBenazzouz, Djamel2015-12-132015-12-13201320407459https://dspace.univ-boumerdes.dz/handle/123456789/2524enAnalytic Redundancy Relations ARRBipartite graphFault DetectionIsolation FDIStructural AnalysisTestable subsystemsTestable subsystems generation for fault detection and isolation using a structural matching rank algorithm testability of an electrical circuitArticle