Khouas, AbdelhakimDessouky, MohamedDerieux, Anne2021-02-232021-02-232001https://dspace.univ-boumerdes.dz/handle/123456789/6504A new statistical method for analog fault simulation is presented. The method takes into account process parameter variations and aims to reduce the number of the computational expensive Monte Carlo simulations often required during analog fault simulation. The technique is illustrated by means of a fifth-order low-pass switched-capacitor filterenAnalogOptimized StatisticalArticle