Khouas, AbdelhakimDerieux, Anne2021-02-232021-02-231999https://dspace.univ-boumerdes.dz/handle/123456789/6508Analog integrated circuit testing and diagnosis is a very challenging problem. The inaccuracy of measurements, the infinite domain of possible values and the parameter deviations are among the major difficulties. During the process of optimizing production tests, Monte Carlo simulation is often needed due to parameter variations, but because of its...enSpeed-upAccuracy analogArticle