Khalfaoui, R.Tobbeche, S.2016-06-192016-06-1920050042-207Xhttps://dspace.univ-boumerdes.dz/handle/123456789/2966enIon-beam mixingRutherford backscatteringAtomic depth profileDetermination of atomic depth profile in ion-beam mixed bilayer systems from the Rutherford backscattering dataArticle