Tahi, HakimTahanout, CherifaBoubaaya, MohamedDjezzar, BoualemMerah, Sidi MohammedNadji, BachariaSaoula, Nadia2017-05-092017-05-0920171530-4388https://dspace.univ-boumerdes.dz/handle/123456789/3565enMagnetic fieldsStressNegative bias temperature instabilityThermal variables controlDegradationIterative closest point algorithmCurrent measurementExperimental investigation of NBTI degradation in power VDMOS transistors under low magnetic fieldArticle