Browsing by Author "Kreissig, U."

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    Quantitative analysis of deuterium in a-C:D layers, a Round Robin experiment
    (2000) Behrisch, R.; Mayer, M.; Jacob, W.; Assmann, W.; Dollinger, G.; Bergmaier, A.; Kreissig, U.; Friedrich, M.; Sun, G.Y.; Hildebrandt, D.; Akbi, Mohamed; Schneider, W.; Schleubner, D.; Knapp, W.; Edelmann, C.
    The absolute amount of deuterium in amorphous deuterated carbon (a-C:D) layers has been measured by six laboratories with di erent techniques, such as MeV ion beam analysis, secondary ion mass spectrometry (SIMS), and thermal desorption spectrometry (TDS). The a-C:D layers have been deposited from a CD 4 glow discharge plasma onto carbon and silicon substrates. The results for the absolute numbers obtained with the di erent analysing techniques show a scatter of up to about 35% around the average value. These deviations are larger than the errors stated by the experimentalists and indicate possible systematic uncertainties in some of the measurements