Statistics for Sputter deposition of titanium and nickel thin films in radio frequency magnetron discharge characterized by optical emission spectroscopy and by rutherford backscattering spectrometry
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| Sputter deposition of titanium and nickel thin films in radio frequency magnetron discharge characterized by optical emission spectroscopy and by rutherford backscattering spectrometry | 0 |
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| M. Salhi, Résumé.pdf | 7 |