Publications Scientifiques
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Item Experimental investigation of NBTI degradation in power VDMOS transistors under low magnetic field(IEEE, 2017) Tahi, Hakim; Tahanout, Cherifa; Boubaaya, Mohamed; Djezzar, Boualem; Merah, Sidi Mohammed; Nadji, Bacharia; Saoula, NadiaItem Oxide trap annealing by H2 cracking at e'center under NBTI stress(IEEE, 2012) Tahanout, Cherifa; Nadji, Becharia; Tahi, Hakim; Djezzar, Boualem; Benabdelmoumene, Abdelmadjid; Chenouf, Amel