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Publications Scientifiques
Publications Scientifiques
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search.filters.author.Tahi, Hakim
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search.filters.author.Djezzar, Boualem
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search.filters.author.Tahanout, Cherifa
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search.filters.author.Benabdelmoumene, Abdelmadjid
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search.filters.author.Boubaaya, Mohamed
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search.filters.subject.Negative bias temperature instability
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search.filters.subject.Annealing
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search.filters.subject.Current measurement
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search.filters.subject.Degradation
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search.filters.subject.Hole traps
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2012 - 2017
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Experimental investigation of NBTI degradation in power VDMOS transistors under low magnetic field
(
IEEE
,
2017
)
Tahi, Hakim
;
Tahanout, Cherifa
;
Boubaaya, Mohamed
;
Djezzar, Boualem
;
Merah, Sidi Mohammed
;
Nadji, Bacharia
;
Saoula, Nadia
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Oxide trap annealing by H2 cracking at e'center under NBTI stress
(
IEEE
,
2012
)
Tahanout, Cherifa
;
Nadji, Becharia
;
Tahi, Hakim
;
Djezzar, Boualem
;
Benabdelmoumene, Abdelmadjid
;
Chenouf, Amel
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