Testable subsystems generation for fault detection and isolation using a structural matching rank algorithm testability of an electrical circuit

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dc.contributor.authorAlem, Said
dc.contributor.authorMokhtari, Hicham
dc.contributor.authorOuziala, Mahdi
dc.contributor.authorBenazzouz, Djamel
dc.date.accessioned2015-12-13T09:35:27Z
dc.date.available2015-12-13T09:35:27Z
dc.date.issued2013
dc.identifier.issn20407459
dc.identifier.urihttps://dspace.univ-boumerdes.dz/handle/123456789/2524
dc.language.isoenen_US
dc.relation.ispartofseriesResearch Journal of Applied Sciences, Engineering and Technology/ Vol.5, N°24 (2013);pp. 8657-8664
dc.subjectAnalytic Redundancy Relations ARRen_US
dc.subjectBipartite graphen_US
dc.subjectFault Detectionen_US
dc.subjectIsolation FDIen_US
dc.subjectStructural Analysisen_US
dc.subjectTestable subsystemsen_US
dc.titleTestable subsystems generation for fault detection and isolation using a structural matching rank algorithm testability of an electrical circuiten_US
dc.typeArticleen_US

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