Lifetime estimation and reliability of PV inverter with Multi-Timescale thermal stress analysis
| dc.contributor.author | Bouguerra, Sara | |
| dc.contributor.author | Agroui, Kamel | |
| dc.contributor.author | Gassab, Oussama | |
| dc.contributor.author | Sangwongwanich, Ariya | |
| dc.contributor.author | Blaabjerg, Frede | |
| dc.date.accessioned | 2021-03-31T11:55:03Z | |
| dc.date.available | 2021-03-31T11:55:03Z | |
| dc.date.issued | 2019 | |
| dc.description.abstract | The reliability of the PV inverter is a critical issue because it is the less reliable component of the PV system. In order to lower the risks of failure and maintenance in PV systems, the factors that influence the PV inverter lifetime should be analyzed. Thermal stress is the main causes of IGBT failure in a PV inverter, which includes the fast cycling stress due to loss variations in an IGBT, and slow cycling due to mission profile fluctuations. In this paper, the design for reliability (DFR) approach based on mission profile analysis is used and demonstrated on a single phase, single stage, grid connected PV inverter installed in Algeria, where the lifetime is estimated by taking the effect of low frequency thermal cycling under long-term operation into consideration, in addition to the line frequency power cycling due to loss variations. The results reveal that low frequency thermal cycling have a significant impact on lifetime degradation and reliability of the PV inverter after many years of operation | en_US |
| dc.identifier.isbn | 978-153867687-5 | |
| dc.identifier.uri | DOI: 10.1109/ACEMP-OPTIM44294.2019.9007221 | |
| dc.identifier.uri | https://ieeexplore.ieee.org/document/9007221 | |
| dc.identifier.uri | https://dspace.univ-boumerdes.dz/handle/123456789/6734 | |
| dc.language.iso | en | en_US |
| dc.publisher | IEEE | en_US |
| dc.relation.ispartofseries | 2019 International Aegean Conference on Electrical Machines and Power Electronics (ACEMP) & 2019 International Conference on Optimization of Electrical and Electronic Equipment (OPTIM); | |
| dc.subject | Design for reliability | en_US |
| dc.subject | Insulated-gate bipolar transistor | en_US |
| dc.subject | Mission profile | en_US |
| dc.subject | Monte Carlo methods | en_US |
| dc.subject | PV inverters | en_US |
| dc.subject | Reliability | en_US |
| dc.subject | Thermal loading | en_US |
| dc.title | Lifetime estimation and reliability of PV inverter with Multi-Timescale thermal stress analysis | en_US |
| dc.type | Other | en_US |