Optimized Statistical Analog Fault Simulation

dc.contributor.authorKhouas, Abdelhakim
dc.contributor.authorDessouky, Mohamed
dc.contributor.authorDerieux, Anne
dc.date.accessioned2021-02-23T09:22:51Z
dc.date.available2021-02-23T09:22:51Z
dc.date.issued2001
dc.description.abstractA new statistical method for analog fault simulation is presented. The method takes into account process parameter variations and aims to reduce the number of the computational expensive Monte Carlo simulations often required during analog fault simulation. The technique is illustrated by means of a fifth-order low-pass switched-capacitor filteren_US
dc.identifier.urihttps://dspace.univ-boumerdes.dz/handle/123456789/6504
dc.language.isoenen_US
dc.subjectAnalogen_US
dc.subjectOptimized Statisticalen_US
dc.titleOptimized Statistical Analog Fault Simulationen_US
dc.typeArticleen_US

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