Speed-up of high accuracy analog test stimulus optimization
| dc.contributor.author | Khouas, Abdelhakim | |
| dc.contributor.author | Derieux, Anne | |
| dc.date.accessioned | 2021-02-23T10:16:08Z | |
| dc.date.available | 2021-02-23T10:16:08Z | |
| dc.date.issued | 1999 | |
| dc.description.abstract | Analog integrated circuit testing and diagnosis is a very challenging problem. The inaccuracy of measurements, the infinite domain of possible values and the parameter deviations are among the major difficulties. During the process of optimizing production tests, Monte Carlo simulation is often needed due to parameter variations, but because of its... | en_US |
| dc.identifier.uri | https://dspace.univ-boumerdes.dz/handle/123456789/6508 | |
| dc.language.iso | en | en_US |
| dc.subject | Speed-up | en_US |
| dc.subject | Accuracy analog | en_US |
| dc.title | Speed-up of high accuracy analog test stimulus optimization | en_US |
| dc.type | Article | en_US |
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