Quantitative analysis of deuterium in a-C:D layers, a Round Robin experiment

dc.contributor.authorBehrisch, R.
dc.contributor.authorMayer, M.
dc.contributor.authorJacob, W.
dc.contributor.authorAssmann, W.
dc.contributor.authorDollinger, G.
dc.contributor.authorBergmaier, A.
dc.contributor.authorKreissig, U.
dc.contributor.authorFriedrich, M.
dc.contributor.authorSun, G.Y.
dc.contributor.authorHildebrandt, D.
dc.contributor.authorAkbi, Mohamed
dc.contributor.authorSchneider, W.
dc.contributor.authorSchleubner, D.
dc.contributor.authorKnapp, W.
dc.contributor.authorEdelmann, C.
dc.date.accessioned2015-04-23T10:09:02Z
dc.date.available2015-04-23T10:09:02Z
dc.date.issued2000
dc.description.abstractThe absolute amount of deuterium in amorphous deuterated carbon (a-C:D) layers has been measured by six laboratories with di erent techniques, such as MeV ion beam analysis, secondary ion mass spectrometry (SIMS), and thermal desorption spectrometry (TDS). The a-C:D layers have been deposited from a CD 4 glow discharge plasma onto carbon and silicon substrates. The results for the absolute numbers obtained with the di erent analysing techniques show a scatter of up to about 35% around the average value. These deviations are larger than the errors stated by the experimentalists and indicate possible systematic uncertainties in some of the measurementsen_US
dc.identifier.issn0022-3115
dc.identifier.urihttps://dspace.univ-boumerdes.dz/handle/123456789/535
dc.language.isoenen_US
dc.relation.ispartofseriesJournal of Nuclear Materials/ Vol.281 (2000);pp. 42-56
dc.subjectDeuteriumen_US
dc.subjectAmorphous deuterated carbon (a-C:D)en_US
dc.subjectPlasmaen_US
dc.subjectSecondary ion mass spectrometry (SIMS)en_US
dc.titleQuantitative analysis of deuterium in a-C:D layers, a Round Robin experimenten_US
dc.typeArticleen_US

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