Seminumerical technique for the analysis of integrated semiconductor devices

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dc.contributor.authorDehmas, Mokrane
dc.contributor.authorZitouni, Abdelkader
dc.contributor.authorBourdoucen, H.
dc.date.accessioned2018-03-06T09:17:32Z
dc.date.available2018-03-06T09:17:32Z
dc.date.issued1994
dc.identifier.urihttps://dspace.univ-boumerdes.dz/handle/123456789/4588
dc.language.isoenen_US
dc.relation.ispartofseriesModelling, Measurement and Control A/ Vol.58, N°2 (1994);pp. 1-6
dc.subjectSeminumerical techniqueen_US
dc.subjectAnalysisen_US
dc.subjectSemiconductor devicesen_US
dc.titleSeminumerical technique for the analysis of integrated semiconductor devicesen_US
dc.typeArticleen_US

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